A BNF-based automatic test program generator for compatible microprocessor verification

The Digital Librarian's Digital Library

DOCIS Documents in Computing and Information Science

Home >> Journals and Conference Proceedings >> ACM Transactions on Design of Automated Electronic Systems

A BNF-based automatic test program generator for compatible microprocessor verification

Lieh-Ming Wu, Kuochen Wang, Chuang-Yi Chiu

Journal Title: ACM Transactions on Design of Automated Electronic Systems

Date: 2004

Volume: 9

Issue: 1

p. 105 - 132

For further information about this item go to:

http://doi.acm.org/10.1145/966142

This data comes from DBLP

This page is maintained by Angela Cornwell and Thomas Krichel.
It was last updated on 2006-04-12