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ACM Transactions on Design of Automated Electronic Systems
Multimode scan: Test per clock BIST for IP cores
Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan
Journal Title: ACM Transactions on Design of Automated Electronic Systems
Date: 2003
Volume: 8
Issue: 4
p. 491 - 505
For further information about this item go to:
http://doi.acm.org/10.1145/944027.944033
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It was last updated on 2006-04-12