Test vector decomposition-based static compaction algorithms for combinational circuits

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Test vector decomposition-based static compaction algorithms for combinational circuits

Aiman H. El-Maleh, Yahya E. Osais

Journal Title: ACM Transactions on Design of Automated Electronic Systems

Date: 2003

Volume: 8

Issue: 4

p. 430 - 459

For further information about this item go to:

http://doi.acm.org/10.1145/944027.944030

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