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DOCIS Documents in Computing and Information Science
 
 
 
SOC test architecture design for efficient utilization of test bandwidth
 
Sandeep Kumar Goel, Erik Jan Marinissen
 
Journal Title: ACM Transactions on Design of Automated Electronic Systems
Date: 2003
Volume: 8
Issue: 4
p. 399 - 429
 
 
 
For further information about this item go to:
http://doi.acm.org/10.1145/944027.944029
 
 
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