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Home >> Journals and Conference Proceedings >> ACM Symposium on Document Engineering
 
 
Compression of scan-digitized Indian language printed text: a soft pattern matching technique
 
Utpal Garain, S. Debnath, A. Mandal, B. B. Chaudhuri
 
Journal Title: ACM Symposium on Document Engineering
Date: 2003
 
 
 
For further information about this item go to:
http://doi.acm.org/10.1145/958254
 
 
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